Publication | Closed Access
Junction temperature and reliability of high-power flip-chip light emitting diodes
23
Citations
10
References
2007
Year
White OledPhotonicsElectrical EngineeringSolid-state LightingEngineeringApplied PhysicsNew Lighting TechnologyCircuit ReliabilityElectronic PackagingJunction TemperatureMicroelectronicsOptoelectronicsDevice Reliability
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