Atomic force microscopy of extended‐chain crystals of polyethylene

Abstract

Abstract Extended‐chain crystals of polyethylene grown at elevated pressure and temperature were analyzed for the first time by atomic force microscopy. It was possible to compare the typical fracture surface striation features with those obtained earlier by electron microscopy. High resolution atomic force microscopy on flat surfaces enabled the recording of an atomic scale regularity that could not be fully indentified. © 1993 John Wiley & Sons, Inc.