John Reffner - Concepedia

Author

John Reffner

Dow Chemical (United States)ORCID

Also Known As

J. R. Reffner, J. Reffner, John R Reffner, John R. Reffner, John Reffner, Reffner, John R.

Publications

257

Citations

H-Index

Concepts

All Affiliations

Dow Chemical (United States)Oak Ridge National Laboratory Lehigh University University of Tennessee at Knoxville Massachusetts Institute of Technology

About

John Reffner is an author at Dow Chemical (United States) specializing in engineering, polymer science, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	198
2	Applied Physics	2	2	70
3	Chemistry	2	2	71
4	Medicine	1	1	13
5	Chemical Engineering	1	1	19

John Reffner

Publications

229

Citations

H-Index

Page 1

	Year	Citations
Determination of surface morphology of diblock copolymers of styrene and butadiene by atomic force microscopy B. K. Annis, Dwight W. Schwark, John Reffner, Die Makromolekulare Chemie Atomic Force MicroscopyEngineeringDiblock CopolymersNanostructured PolymerChemistry	1992	45
Characterization of the surface morphology of diblock copolymers via low-voltage, high-resolution scanning electron microscopy and atomic force microscopy Dwight W. Schwark, D. L. Vezie, John Reffner, Journal of Materials Science Letters Materials ScienceBlock Co-polymersEngineeringElectron MicroscopyDiblock Copolymers	1992	45
Influence of carbon black and carbon nanotubes on the conductivity, morphology, and rheology of conductive ternary polymer blends Paul J. Brigandi, Jeffrey M. Cogen, John Reffner, Polymer Engineering and Science EngineeringMechanical EngineeringNanostructured PolymerPolymer NanocompositesChemistry	2017	26
Kinetic and thermodynamic control in conductive <scp>PP/PMMA/EAA</scp> carbon black composites Paul J. Brigandi, Jeffrey M. Cogen, Casey A. Wolf, Journal of Applied Polymer Science EngineeringMechanical EngineeringPolymer NanocompositesAnnealing TimeThermoplastic Composite	2015	25
Atomic force microscopy of extended‐chain crystals of polyethylene Brain K. Annis, John Reffner, Bernhard Wunderlich Journal of Polymer Science Part B Polymer Physics Atomic Force MicroscopyEngineeringAbstract Extended‐chain CrystalsMechanics ModelingPolymers	1993	25
Three-Dimensional Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam–Scanning Electron Microscopy Jui-Ching Lin, William A. Heeschen, John Reffner, Microscopy and Microanalysis	2012	19
The effect of inorganic and organic nucleating agents on the electrical breakdown strength of polyethylene Karl M. Seven, Jeffrey M. Cogen, Tim Person, Journal of Applied Polymer Science EngineeringPolyethylene AffectsNanostructured PolymerPolymer NanocompositesElectrical Breakdown Strength	2018	19
Application of atomic force microscopy (AFM) to a block copolymer and an extended chain polyethylene B. K. Annis, Donald W. Noid, Bobby G. Sumpter, Die Makromolekulare Chemie Rapid Communications Materials ScienceAtomic Force MicroscopyPolymer MaterialEngineeringBlock Copolymer	1992	13
Eliminating the <i>T</i><sub>g</sub>-Confinement Effect in Polystyrene Films: Extraordinary Impact of a 2 mol % 2-Ethylhexyl Acrylate Comonomer Tong Wang, Sumeng Hu, Sipei Zhang, Macromolecules	2022	12

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