Publication | Closed Access
On the suitability of DD and HD models for the simulation of nanometer double-gate MOSFETs
60
Citations
10
References
2003
Year
Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsBias Temperature InstabilityHd ModelsApplied PhysicsNanometer Double-gate MosfetsMicroelectronicsCircuit Simulation
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