A 65nm low-power embedded DRAM with extended data-retention sleep mode

T. Nagai, M. Wada, Akira Suzuki, Toshiyuki Takai, N. Itoga, Tsuyoshi Miyazaki, H. Takenaka, T. Hojo, Satoru Miyano

2006 · 23 citations · 0 references

Concepts

Abstract

An extended data retention (EDR) sleep mode with ECC and MT-CMOS is proposed for embedded DRAM power reduction. In sleep mode, the retention time improves by 8 times and the leakage current is reduced to 13% of the normal operation mode. Since ECC scrubbing operates only in the EDR sleep mode, read/write performance is not degraded. A 65nm low-power embedded DRAM macro featuring 400MHz operation and 0.39mW of data-retention power is realized