Applied Physics Letters · 2013 · 14 citations · 23 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesOptoelectronic MaterialsPhotovoltaic MaterialsSemiconductor Device MaterialsSolar Cell MaterialsSolar CellsWide Band Gap SemiconductorsCarrier LifetimeCarrier Lifetime MeasurementGallium Nitride (Gan) MaterialsLow-temperature GrowthLow-temperature MaterialsMolecular Beam EpitaxyPhotocathodesResistivity
We report a photoconductive switch using low temperature grown GaNAsSb as the active material. The GaNAsSb layer was grown at 200 °C by molecular beam epitaxy in conjunction with a radio frequency plasma-assisted nitrogen source and a valved antimony cracker source. The low temperature growth of the GaNAsSb layer increased the dark resistivity of the switch and shortened the carrier lifetime. The switch exhibited a dark resistivity of 107 Ω cm, a photo-absorption of up to 2.1 μm, and a carrier lifetime of ∼1.3 ps. These results strongly support the suitability of low temperature grown GaNAsSb in the photoconductive switch application.
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All-fiber terahertz time-domain spectrometer operating at 1.5 μm telecom wavelengths
B. Sartorius, H. Roehle, H. Künzel et al. · Optics Express · 2008 · 259 citations · Full text