Multiple-output parity bit signature for exhaustive testing

Built-In Self-Test Techniques

Edward R. McCluskey · IEEE Design & Test of Computers · 1985 · 422 citations

Engineering, Computer Engineering, Electrical Engineering +16

Design for Autonomous Test

McCluskey, Bozorgui-Nesbat · IEEE Transactions on Computers · 1981 · 225 citations

Engineering, Computer Engineering, Computer Science +17

Syndrome-Testable Design of Combinational Circuits

Savir · IEEE Transactions on Computers · 1980 · 208 citations

Engineering, Computer Engineering, Computer Science +8

Transition Count Testing of Combinational Logic Circuits

Hayes · IEEE Transactions on Computers · 1976 · 124 citations

Engineering, Computer Engineering, Computer Science +11

Testing by Verifying Walsh Coefficients

Susskind · IEEE Transactions on Computers · 1983 · 111 citations

Engineering, Computer Engineering, Computer Science +12