Concepedia

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

A. P. Hitchcock, T. Tyliszczak, Martin Obst, G. D. W. Swerhone, Joseph R. Lawrence

Microscopy and Microanalysis · 2010 · 12 citations · 0 references

Open access

Concepts

Natural SciencesMaterials EngineeringMaterials ScienceSpectroscopyFluorescence MicroscopyX-ray Data AnalysisX-ray Fluorescence AnalysisX-ray OpticsX-ray SpectroscopyMicroanalysisSoft X-ray SpectroscopyX-ray Fluorescence DetectionX-ray Fluorescence Spectroscopy

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.