Publication | Closed Access
Multi-Subband Ensemble Monte Carlo simulation of bulk MOSFETs for the 32nm-node and beyond
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Citations
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References
2011
Year
Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronicsNatural SciencesBias Temperature InstabilityNumerical SimulationCondensed Matter PhysicsApplied PhysicsMonte Carlo MethodMonte CarloMicroelectronicsBulk MosfetsCircuit SimulationMultiscale Modeling
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