SAXES, a high resolution spectrometer for resonant x-ray emission in the 400–1600eV energy range

TLDR

The spectrometer is designed for resonant x‑ray emission spectroscopy and resonant inelastic x‑ray scattering in the 400–1600 eV range. It employs a 5‑m long variable‑line‑spacing spherical grating (3200 mm⁻¹, R = 58.55 m) with a 2‑D CCD detector and a rotating platform that varies the scattering angle from 25° to 130°, and will operate at the ADRESS beamline of the Swiss Light Source from 2007. Tests demonstrate a resolving power above 10 000 below 1100 eV, 7 000 at 1500 eV, and up to 12 000 and 17 000 at the Cu L3 (930 eV) and Ti L3 (470 eV) edges, respectively.

Abstract

We present a 5m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400–1600eV energy range. It is based on a variable line spacing spherical grating (average groove density of 3200mm−1, R=58.55m) and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10μm, the targeted resolving power is higher than 10 000 at all energies below 1100eV and better than 7000 at 1500eV. The off-line tests made with Al and MgKα1,2 fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L3 edges of Cu (930eV) and of Ti (470eV), respectively. SAXES (superadvanced x-ray emission spectrometer) is mounted on a rotating platform allowing to vary the scattering angle from 25° to 130°. The spectrometer will be operational at the ADRESS (advanced resonant spectroscopies) beamline of the Swiss Light Source from 2007.