X. Wang

High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

Vladimir N. Strocov, Thorsten Schmitt, U. Flechsig et al. · Journal of Synchrotron Radiation · 2010 · 373 citations · Full text

X-ray Spectroscopy, Engineering, Beamline Optics +16

SAXES, a high resolution spectrometer for resonant x-ray emission in the 400–1600eV energy range

G. Ghiringhelli, A. Piazzalunga, C. Dallera et al. · Review of Scientific Instruments · 2006 · 285 citations · Full text

X-ray Spectroscopy, Polycapillary Optics, Synchrotron Radiation Source +18

Soft-X-ray ARPES facility at the ADRESS beamline of the SLS: concepts, technical realisation and scientific applications

Vladimir N. Strocov, X. Wang, M. Shi et al. · Journal of Synchrotron Radiation · 2013 · 166 citations · Full text

Adress Beamline, Engineering, X-ray Spectroscopy +19

SLS Crystallization Platform at Beamline X06DA—A Fully Automated Pipeline Enabling <i>in Situ</i> X-ray Diffraction Screening

R. Bingel-Erlenmeyer, Vincent Oliéric, James Grimshaw et al. · Crystal Growth & Design · 2011 · 93 citations

Observation of Two Nondispersive Magnetic Excitations in NiO by Resonant Inelastic Soft-X-Ray Scattering

G. Ghiringhelli, A. Piazzalunga, C. Dallera et al. · Physical Review Letters · 2009 · 83 citations · Full text

High Resolution, X-ray Spectroscopy, Engineering +20