Publication | Closed Access
Applications of atomic force microscopy to structural characterization of organic thin films
28
Citations
109
References
1994
Year
Materials ScienceAtomic Force MicroscopyStructural CharacterizationEngineeringMicroscopyScanning Probe MicroscopyApplied PhysicsScanning Force MicroscopyOrganic SemiconductorOrganic Thin FilmsThin FilmsThin Film Processing
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