Direct observation of Ag intercell hopping on the Si(1 1 1)-(7 × 7) surface

Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy

K. Takayanagi, Y. Tanishiro, Masaetsu Takahashi et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1985 · 1.3K citations

Natural Sciences, Materials Engineering, Materials Science +17

Noise in Semiconductors: Spectrum of a Two-Parameter Random Signal

Stefan Machlup · Journal of Applied Physics · 1954 · 580 citations

Engineering, Electrical Engineering, Physics +11

Direct measurement of diffusion by hot tunneling microscopy: Activation energy, anisotropy, and long jumps

Eric Ganz, Silva K. Theiss, Ing‐Shouh Hwang et al. · Physical Review Letters · 1992 · 209 citations

Natural Sciences, Materials Science, Physics +17

Real-time observations of vacancy diffusion on Si(001)-(2×1) by scanning tunneling microscopy

N. Kitamura, M. G. Lagally, M. B. Webb · Physical Review Letters · 1993 · 135 citations

Natural Sciences, Materials Engineering, Materials Science +17

Energetics and Dynamics of Si Ad-Dimers on Si(001)

Zhenyu Zhang, Fang Wu, Harold J. W. Zandvliet et al. · Physical Review Letters · 1995 · 117 citations · Full text

Natural Sciences, Materials Science, Physics +13