Journal of Applied Crystallography · 2010 · 58 citations · 8 references
Natural SciencesMaterials ScienceMetrologyRadiation DetectionRadiation MeasurementX-ray CrystallographyX-ray Data AnalysisX-ray DetectionX-ray DetectorsX-ray DiffractionX-ray OpticsAngular Instrument CalibrationAngular PrecisionDistortionsFlat-panel DetectorsPowder Diffraction AnalysisPowder X-ray DiffractionThree-dimensional Metrology
CONEX is a Windows application for converting series of two-dimensional X-ray powder patterns measured on flat two-dimensional detectors into one-dimensional scattering patterns. It is based on the rigorous use of scattering patterns of calibration samples to determine the three-dimensional position of the detector, with respect to the sample and to the beam. This enables correction of the data for geometric distortions, even when the detector is highly tilted and not centred on the beam.
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<i>Numerical Recipes, The Art of Scientific Computing</i>
William H. Press, Brian P. Flannery, Saul A. Teukolsky et al. · American Journal of Physics · 1987 · 10.1K citations