X-Ray Photoelectron Spectroscopic Studies of Valence States Produced by Ion-Sputtering Reduction

Lo I Yin, Subrata Ghose, I. Adler

Applied Spectroscopy · 1972 · 63 citations · 8 references

Concepts

Abstract

X-ray photoelectron spectroscopic measurements of various valence states of Fe and Cu in several compounds using ion-sputtering reduction are presented, and the potential usefulness of this time-dependent and in situ method is discussed.

References

8