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Scanning and transmission electron microscope images of a suspended single-walled carbon nanotube
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Citations
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References
2006
Year
EngineeringMicroscopyCarbon-based MaterialElectron MicroscopyMicroscopy MethodNanoelectronicsSimultaneous ObservationsNanometrologyTransmission Electron MicroscopeCarbon NanotubesMaterials ScienceElectrical EngineeringPhysicsNanotechnologyMicroanalysisNanomaterialsScanning Probe MicroscopyApplied PhysicsMicroscope ImagesElectron MicroscopeNanotubes
For the first time we perform simultaneous observations of individual single-walled carbon nanotubes using scanning electron microscope (SEM) and transmission electron microscope modes of a transmission electron microscope equipped with a scanning attachment operating at 100kV. We show that in the SEM mode both individual single-walled carbon nanotubes situated on thin Si3N4 membranes and portions of these tubes projecting far beyond the membranes can be observed. The contrast and width of the nanotube images depend on their diameter and density on a substrate. Possible mechanisms of the observed nanotube contrast are discussed.
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