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Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes
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2001
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Semiconductor TechnologyElectrical EngineeringEngineeringCrystalline DefectsCrystal DefectsApplied PhysicsCondensed Matter PhysicsDefect FormationDefect Tolerance4H-sic DiodesSemiconductor Device
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