Journal of Physics D Applied Physics · 2012 · 21 citations · 23 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsDopingOxide SemiconductorsSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor PhysicsThermal Properties Of SemiconductorsInterstitial SitesMolecular Beam EpitaxyN-type Oxide SemiconductorsSecondary Ion Mass SpectrometrySolid Solubility EnhancementSolubilityThermal Stability
Abstract We demonstrate the growth of Be x Zn 1− x O alloy thin films on c-sapphire substrates by plasma-assisted molecular beam epitaxy. The formation of Be x Zn 1− x O is very sensitive to the Be content in the alloy. Be atoms occupy the Zn lattice sites at low Be content, but move partly to the interstitial sites with increasing Be content. We also investigated the thermal stability of N, one of the most frequently used p-type dopants, in the Be x Zn 1− x O films. Secondary ion mass spectrometry shows that Be element plays a crucial role in stabilizing N in the Be x Zn 1− x O host, which is favourable in improving the solid solubility and the thermal stability of acceptor dopants in ZnO-based wide-gap semiconductors.
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