Structural, electrical and optical studies on chemically deposited tin oxide films from inorganic precursors

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Natural Sciences, Materials Engineering, Materials Science +17

Elements of X-ray diffraction

H. Lipson · Contemporary Physics · 1979 · 3.5K citations

Natural Sciences, Materials Science, Physics +9

Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials

S. H. Wemple, M. DiDomenico · Physical review. B, Solid state · 1971 · 3K citations

Natural Sciences, Chemistry, Physics +17

New figure of merit for transparent conductors

G. Haacke · Journal of Applied Physics · 1976 · 2.1K citations

Natural Sciences, Materials Engineering, Materials Science +17

Electrical and optical properties of undoped and antimony-doped tin oxide films

E. Shanthi, Viresh Dutta, Arghya Narayan Banerjee et al. · Journal of Applied Physics · 1980 · 491 citations

Natural Sciences, Materials Science, Physics +17