Applied Physics Letters · 2011 · 43 citations · 21 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSolid State PhysicsAluminum OxidesAmorphous MaterialsAmorphous SolidsDefect ModelingDefects In Electronic MaterialsElectrical Properties Of CeramicsAluminaAmorphous Aluminum OxidesDefect Energy LevelsElectronic Structure AnalysisElectronic Structure Of DefectsNonvolatile Memory DevicesOxygen VacanciesResistive Switching
Electronic and atomic structures associated with a vacancy-type oxygen deficiency in an amorphous alumina model are studied by first-principles calculations. The energy levels of the oxygen defects significantly shift depending on their charge states because of remarkable changes of local atomic structures. That is different in character from the α crystal case. We discuss a possibility of the oxygen defects as a conductive path and present an atomistic mechanism of the resistive switching effects in the memory devices.
21
Self-Consistent Equations Including Exchange and Correlation Effects
W. Kohn, L. J. Sham · Physical Review · 1965 · 63.2K citations · Full text
Nanoionics-based resistive switching memories
Rainer Waser, Masakazu Aono · Nature Materials · 2007 · 4.8K citations
Natural Sciences, Materials Engineering, Materials Science +12