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Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures

Materials ScienceSurface CharacterizationEngineeringOptical PropertiesSurface AnalysisSurface ScienceApplied PhysicsAnalytic SolutionsThin FilmsThin Film StructuresOptimized Ellipsometric MeasurementsDepth-graded Multilayer CoatingThin Film Processing