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Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry

Materials ScienceInfra-red Spectroscopic EllipsometrySurface CharacterizationAluminium NitrideEngineeringNon-functional Organosilane FilmsSurface ScienceChemistryThin Film ProcessingAnodizing