Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy

Abstract

We investigated the piezoresistive properties of single-wall carbon nanotubes (SWCNTs) under the tip-induced force in the radial direction using atomic force microscopy. We found that the conductance of the bundled SWCNTs was modulated by the applied radial force. The polarity and amount of the conductance change were different on every bundle and even dependent on the location where the force was applied. These phenomena were explained by the modulation of the band structures of the SWCNTs, which was caused by the deformation at the critical pressure.