Concepedia

Publication | Open Access

Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences

DOIFull Paper Access

17

Citations

4

References

2011

Year

Binhong Li, Néstor Berbel, Alexandre Boyer, S. Bendhia, Raúl Fernández‐García
Microelectronics Reliability

References

YearCitations

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