Applied Physics Letters · 2006 · 14 citations · 14 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesThin FilmsOptical Thin FilmsPhotodetectorsSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor Thin FilmsUltraviolet DetectorsAmorphous SiliconDark CurrentMetal-semiconductor-metal PhotodetectorsNitride Thin FilmsPhotodetectionPhotodetector MaterialsQuantum EfficiencyUltraviolet Photodetectors
Photoconductivity of amorphous silicon carbon nitride (a-SiCN) as a function of incident photon energies has been studied. A metal-semiconductor-metal photodetector device based on the a-SiCN thin film demonstrates excellent selective ultraviolet sensing features. A large photo-to-dark current ratio about 5000 and a relative quantum efficiency about ∼105 under illumination of the 250nm light source and a bias voltage of 5V were observed. A model based on the heterogeneous structure in the a-SiCN thin film which consists of π−π* bands and σ−σ* bands was introduced to account for the observed photoconductive transport properties.
14
Optical Properties and Electronic Structure of Amorphous Germanium
J. Tauc, R. Grigorovici, A. Vancu · physica status solidi (b) · 1966 · 10.7K citations
Carbon Nitride Deposited Using Energetic Species: A Two-Phase System
D. Marton, Kevin J. Boyd, A. Al-Bayati et al. · Physical Review Letters · 1994 · 769 citations
Natural Sciences, Materials Engineering, Materials Science +13
Crystalline silicon carbon nitride: A wide band gap semiconductor
Li–Chyong Chen, C. K. Chen, Shih‐Chun Wei et al. · Applied Physics Letters · 1998 · 165 citations
Natural Sciences, Materials Engineering, Materials Science +17