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A semi-empirical method of absorption correction
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1968
Year
Optical MaterialsEngineeringWave OpticOptic DesignAbsorption SpectroscopyBeam OpticSurface ReflectanceCalibrationOptical PropertiesNumerical SimulationReflectionReflectanceStatisticsAxial ReflectionPhysicsGeneral Reflexion HklRadiative AbsorptionClassical OpticsRelative Transmission TCrystallographyNatural SciencesSpectroscopyGeometrical OpticApplied PhysicsAbsorption CorrectionAtomic AbsorptionOptical System AnalysisDiffractive Optic
An extension of Furnas's method is described. The variation of intensity of an axial reflection as the crystal is rotated about the goniometer axis is used to give a curve of relative transmission T against azimuthal angle ϕ for the corresponding reciprocal lattice level. Transmission coefficients for any general reflexion hkl are then given approximately by T(hkl) = [T(ϕinc) + T(ϕret)]/2 where ϕinc and ϕret are the azimuthal angles of the incident and reflected beams. Equations are derived for (ϕinc and ϕret and the accuracy of the method is discussed.
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