EMI-induced failures in integrated circuit operational amplifiers

Computer-Aided Analysis of RFI Effects in Operational Amplifiers

Joseph G. Tront, James W. Whalen, C. E. Larson et al. · IEEE Transactions on Electromagnetic Compatibility · 1979 · 53 citations

Engineering, Electrical Engineering, Analog Electronics +16

Macromodel Predictions for EMI in Bipolar Operational Amplifiers

Gordon K. C. Chen, James J. Whalen · IEEE Transactions on Electromagnetic Compatibility · 1980 · 30 citations

Engineering, Electrical Engineering, Analog Electronics +16

Using NCAP to Predict RFI Effects in Linear Bipolar Integrated Circuits

Ta-Fang Fang, James J. Whalen, Gordon K. C. Chen · IEEE Transactions on Electromagnetic Compatibility · 1980 · 24 citations

Engineering, Electrical Engineering, Analog Electronics +15