Design and characterization of MIKES metrological atomic force microscope

Statistics of atomic frequency standards

D.W. Allan · Proceedings of the IEEE · 1966 · 2.7K citations

Natural Sciences, Physics, Spectroscopy +16

Determination and correction of quadrature fringe measurement errors in interferometers

Peter L. M. Heydemann · Applied Optics · 1981 · 420 citations

Engineering, Astronomy, Metrology +14

Measurement of the refractive index of air and comparison with modified Edl n's formulae

G B nsch, Eckhard Potulski · Metrologia · 1998 · 377 citations

Natural Sciences, Meteorology, Atmospheric Chemistry +14

Investigation and compensation of the nonlinearity of heterodyne interferometers

Wenmei Hou, Günter Wilkening · Precision Engineering · 1992 · 182 citations

Natural Sciences, Electrical Engineering, Physics +10

Metrological large range scanning probe microscope

Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink et al. · Review of Scientific Instruments · 2004 · 151 citations

Engineering, Mechatronics Engineering, Instrumentation +16