Journal of Applied Physics · 2008 · 13 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSurface ScienceThin FilmsOrganic SemiconductorsPolymer Thin FilmsSurface MorphologySurface PhysicsThin Film Surface MorphologyThin-film MaterialsAtomic Force Microscopy AnalysisFilm Growth MechanismsFilm MorphologyFilm-substrate InteractionThin Film Surface CharacterizationThin-film Growth MechanismsThin-film MorphologyX-ray Diffraction Analysis
In this study the structural and morphological properties of perylene films deposited on different substrates have been investigated. The film properties have been studied by employing a range of techniques including atomic force microscopy, x-ray diffraction, and drop shape analysis for the determination of the surface free energy. For films deposited on top of Al2O3, the perylene molecules have a fiber texture ordering perpendicular to the substrate, while for films deposited on top of a Au(111) layer, only for thicker films above 400nm were diffraction peaks observed. The different growths of perylene on top of these substrates are attributed to the different strengths of the molecule-substrate interaction.
14
Van der Waals epitaxy for highly lattice-mismatched systems
Atsushi Koma · Journal of Crystal Growth · 1999 · 368 citations
George G. Malliaras, Richard H. Friend · Physics Today · 2005 · 362 citations