Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elements

Range and stopping-power tables for heavy ions

L. C. Northcliffe, Roland Schilling · Atomic Data and Nuclear Data Tables · 1970 · 2.7K citations

Natural Sciences, Nuclear Engineering, Physics +13

X-ray analysis: Elemental trace analysis at the 10−12 g level

T. Johansson, Roland Akselsson, Sven Johansson · Nuclear Instruments and Methods · 1970 · 482 citations

Natural Sciences, Chemistry, Materials Science +9

Proton induced X-ray emission as a tool for trace element analysis

F. Folkmann, C. Gaarde, Torben Huus et al. · Nuclear Instruments and Methods · 1974 · 285 citations

Natural Sciences, Chemistry, Radiology +14

Full-range solution for the measurement of thin-film surface densities with proton-excited x rays

F. William Reuter, Harold P. Smith · Journal of Applied Physics · 1972 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +15

Depth profile determination by ion-induced X-ray spectroscopy

W. Pabst · Nuclear Instruments and Methods · 1974 · 45 citations

Natural Sciences, Materials Science, Radiation Detection +11