The growth of organic thin films on silicon substrates studied by X-ray reflectometry

Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt · Physical Review · 1954 · 5.1K citations

Natural Sciences, Chemistry, Materials Science +15

X-ray and neutron scattering from rough surfaces

S. K. Sinha, E. B. Sirota, Stephen Garoff et al. · Physical review. B, Condensed matter · 1988 · 2.4K citations

Natural Sciences, Physics, Optics +16

Elastic Constants of Compression-Annealed Pyrolytic Graphite

O.L Blakslee, D. G. Proctor, E. J. Seldin et al. · Journal of Applied Physics · 1970 · 938 citations

Natural Sciences, Materials Engineering, Materials Science +15

Characterization of surfaces by grazing X-ray reflection: Application to the study of the polishing of various silicate glasses

L. Névot, Paul Jerome Croce · 1980 · 578 citations

Natural Sciences, Materials Engineering, Materials Science +13

X-ray specular reflection studies of silicon coated by organic monolayers (alkylsiloxanes)

I. M. Tidswell, B. M. Ocko, P. S. Pershan et al. · Physical review. B, Condensed matter · 1990 · 362 citations · Full text

Natural Sciences, Chemistry, Materials Science +17