Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2007 · 11 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMechanical Behavior Of MaterialsSemiconductor MaterialsDevice ReliabilityFracture MechanicsMicrofabrication MaterialsStress-strain BehaviorThin Film Mechanical PropertiesBendingFlexible ElectronicsFlexible SubstratesMechanical Stress ResponseStress-induced Failure
The mechanism of failure of patterned ITO electrodes on PET was investigated under static and cyclic bending in the mechanical stress mode. When mechanical stresses are increased, two types of micro-cracks are observed depending on the stress modes. The direction of the micro-crack in ITO electrodes is perpendicular to the load for the static mode. The electrical resistance of an ITO electrode is related to the density of the micro-cracks and failure mechanism of ITO electrode.
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