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Optical diagnostics for characterization of electron energy distributions: argon inductively coupled plasmas
46
Citations
40
References
2011
Year
EngineeringPlasma ScienceElectron Energy DistributionsPlasma PhysicsMtorr Pressure RangeElectron SpectroscopyOptical DiagnosticsOptical PropertiesPlasma PhotonicsInstrumentationPlasma DiagnosticsPhysicsApplied Plasma PhysicElectron KineticsMaxwellian EedfNatural SciencesSpectroscopyApplied PhysicsPlasma Application
The assumption of thermodynamic equilibrium in low-temperature plasmas can lead to errors in determination of electron energy distribution functions (EEDFs) using optical diagnostics. Significant improvements in the accuracy of EEDFs determined using optical diagnostics on argon-containing inductively coupled plasmas (ICPs) are possible by fitting an analytic representation of the EEDF with two adjustable parameters (x and Tx) to recorded optical emission spectra. This so-called x-form of the EEDF captures the well-known suppression of the high-energy portion of the EEDF (compared with the Maxwellian form) observed in ICPs. A review of electron kinetics summarizes the physical mechanisms that lead to this form, and explains the weak dependence of x on operating pressure. For the 1–25 mTorr pressure range of argon-containing mixtures in the system examined, the fixed value x = 1.2 is found to represent the EEDF very well, followed by a near linear increase in x with pressure from x = 1.2 to 1.6 in the 25–50 mTorr range. Significantly improved agreement between predictions of effective electron temperature with a global model and both probe and optical measurements when a Maxwellian EEDF is replaced by the x-form further highlights the benefit of the x-form in improved accuracy in determining the EEDF with optical diagnostics.
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