Journal of Applied Physics · 1991 · 28 citations · 15 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor MaterialsOptical Properties Of SemiconductorsQuantum WellsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsWide Band Gap SemiconductorsDevice FabricationQuantum Well StructuresSemiconductor CharacterizationSemiconductor NanostructuresStrain EffectsStrain Effects On Optical PropertiesStrained Layer StructuresStrained-layer Heterostructures
Photoreflectance line shapes of various semiconductor microstructures were discussed in this paper. Formulas suitable for application in low-dimensional structures were given and used to analyze experimental results from various semiconductor microstructures including GaAs nipi structures, GaAs/AlGaAs multiple quantum wells, InGaAs/GaAs strained-layer superlattices, and
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