Deposition of Potential Energy in Solids by Slow, Highly Charged Ions

Abstract

We have measured the deposition of potential energy of slow $(\ensuremath{\sim}6\ifmmode\times\else\texttimes\fi{}{10}^{5}\mathrm{m}/\mathrm{s})$, highly charged ions in solids with an ion implanted silicon detector. A large fraction (about $35%$ or 60 keV) of the potential energy dissipated by ${\mathrm{Au}}^{69+}$ ions can be traced in electronic excitations deep $(>50\mathrm{nm})$ inside the solid. In contrast, only about $10%$ of the potential energy has been accounted for in measurements of emitted secondary particles.