Publication | Closed Access
Mechanism for serrated cathode dissolution in Cu/Sn/Cu interconnect under electron current stressing
71
Citations
29
References
2012
Year
Materials ScienceMaterials EngineeringElectrical EngineeringElectromigration TechniqueEngineeringSerrated Cathode DissolutionApplied PhysicsCu/sn/cu InterconnectInterconnect (Integrated Circuits)Electron Current StressingElectrochemistry
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