A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization

François Le Henaff, Stéphane Azzopardi, Jean-Yves Delétage, E. Woirgard, Serge Bontemps, Julien Joguet

Microelectronics Reliability · 2012 · 53 citations · 8 references

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