Quantitative phase imaging by three-wavelength digital holography

Abstract

Three-wavelength digital holography is applied to obtain surface height measurements over several microns of range, while simultaneously maintaining the low noise precision of the single wavelength phase measurement. The precision is preserved by the use of intermediate synthetic wavelength steps generated from the three wavelengths and the use of hierarchical optical phase unwrapping. As the complex wave-front of each wavelength can be captured simultaneously in one digital image, real-time performance is achievable.