Applied Physics Express · 2008 · 20 citations · 19 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsOptical Properties Of SemiconductorsQuantum ConfinementQuantum DotsSemiconductor Device MaterialsSemiconductor NanomaterialsSemiconductor PhysicsAnnealingAnnealing Process OptimizationCritical ThicknessMolecular Beam EpitaxyPhotoluminescencePhotoluminescence SpectroscopySelf-assembled Quantum DotsSemiconductor Quantum Dots
We have studied a self-assembled growth technique to form ultra-low density InAs quantum dots on GaAs by molecular beam epitaxy. After growing a GaAs layer under a particular condition, we have deposited an InAs layer of far less than the critical thickness and performed an annealing process. By optimizing these process steps, the density of dots is successfully controlled over a wide range from 104 to 108 cm-2, at which the average interdot distance gets as long as 100 µm. Photoluminescence spectra of low dot density samples have shown discrete single-dot features even under a macroscopic optical excitation. These dots are found to be formed preferentially on GaAs mounds especially when the dot density is around 2.5×105 cm-2.
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