A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique - Concepedia

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A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique

37

Citations

7

References

1989

Year

A. Diligenti, Paolo Bagnoli, Bruno Neri, Seongtae Bea, L. Mantellassi

Solid-State Electronics

Electrical EngineeringElectromigration TechniqueEngineeringResistorSpecific ResistanceMicrofabricationApplied PhysicsNoise TechniqueElectronic PackagingMicroelectronicsElectrical Insulation

References

	Year	Citations

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