Solid-State Electronics · 1989 · 37 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesElectrical CharacterizationIntegrated Circuit DesignIntegrated Circuit DevicesNoise In Electronic DevicesNoise In Semiconductor DevicesSemiconductor Thin FilmsElectromigrationElectromigration AnalysisElectromigration ReliabilityNoise In ResistorsResistors
7
Thin Films—Interdiffusion and Reactions
J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations
Natural Sciences, Materials Engineering, Materials Science +12
Percolation Theory and Electrical Conductivity
Brian J. Last, D. J. Thouless · Physical Review Letters · 1971 · 498 citations