Artifacts in transmission electron microscope images of artificially layered metallic superlattices

Abstract

Both uniform and irregular artificially layered superlattice structures can exhibit a variety of misleading image artifacts in transmission electron microscopy when the layer normal is not perpendicular to the beam direction. These include apparent ‘‘layer dislocations,’’ and the origins of these and other artifacts, as observed in Cu/NiPd superlattices, are discussed.