C. S. Baxter - Concepedia

Author

C. S. Baxter

University of Cambridge

Also Known As

C. S. Baxter, C.S. Baxter, Callum Baxter

Publications

300

Citations

H-Index

Concepts

All Affiliations

University of Cambridge BT Group (United Kingdom)

About

C. S. Baxter is an author at University of Cambridge specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	277
2	Applied Physics	9	9	277
3	Materials Science	8	8	263
4	Materials Engineering	2	2	117
5	Natural Sciences	1	1	14

C. S. Baxter

Publications

287

Citations

H-Index

Page 1

	Year	Citations
The morphology of ordered structures in III–V alloys: inferences from a TEM study C. S. Baxter, W. M. Stobbs, J.H. Wilkie Journal of Crystal Growth Materials ScienceMaterials EngineeringEngineeringTem StudyApplied Physics	1991	98
High-resolution lattice imaging reveals a ‘phase transition’ in Cu/NiPd multilayers C. S. Baxter, W. M. Stobbs Nature Materials ScienceNanoscale ScienceMaterial AnalysisEngineeringApplied Physics	1986	40
TEM methods for the characterization of fine metal multilayers C. S. Baxter, W. M. Stobbs Ultramicroscopy Materials ScienceSurface CharacterizationEngineeringSurface ScienceApplied Physics	1985	28
Sputter deposition of single crystal metal multilayers R.E. Somekh, C. S. Baxter Journal of Crystal Growth Materials ScienceEngineeringSurface ScienceApplied PhysicsSputter Deposition	1986	23
Low temperature diffusion measurements on d.c. sputtered multilayers of Nb/Ta R.E. Somekh, Z. H. Barber, C. S. Baxter, Journal of Materials Science Letters Materials ScienceEngineeringDiffusion ResistanceSurface ScienceApplied Physics	1984	22
The characterisation of the ordering of movpe grown III–V alloys using transmission electron microscopy C. S. Baxter, R. F. Broom, W. M. Stobbs Surface Science Materials ScienceMaterials EngineeringIi-vi SemiconductorEngineeringTransmission Electron Microscopy	1990	19
The effects of strain on the growth of lattice mismatched superlattices K.J. Monserrat, J.N. Tothill, J. Haigh, Journal of Crystal Growth Materials ScienceEngineeringDislocation InteractionPhysicsSevere Plastic Deformation	1988	17
Artifacts in transmission electron microscope images of artificially layered metallic superlattices C. S. Baxter, W. M. Stobbs Applied Physics Letters Metallic SuperlatticesEngineeringMicroscopyElectron DiffractionCu/nipd Superlattices	1986	16
The quantitative determination of the degree of ordering of Ga<sub>0·51</sub>In<sub>0·49</sub>P using transmission electron microscopy C. S. Baxter, W. M. Stobbs Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties X-ray CrystallographyEngineeringElectron MicroscopyPhysicsMicroscopy	1994	14
<b>Observation of the track of a misfit dislocation in ordered Ga<sub>0.5</sub>In<sub>0.5</sub>P</b> C. S. Baxter, W. M. Stobbs, C. J. Gibbings Philosophical Magazine Letters	1993	10

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