Non-destructive depth profile analysis using synchrotron radiation excited XPS

Atomic subshell photoionization cross sections and asymmetry parameters: 1 ⩽ Z ⩽ 103

J. J. Yeh, I. Lindau · Atomic Data and Nuclear Data Tables · 1985 · 4.9K citations

Natural Sciences, Physics, Atomic Physics +2

Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments

Peter J. Cumpson, M. P. Seah · Surface and Interface Analysis · 1997 · 523 citations

Natural Sciences, Materials Engineering, Materials Science +15

Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

Peter J. Cumpson · Journal of Electron Spectroscopy and Related Phenomena · 1995 · 336 citations

Computing, Electrical Engineering, Optics +1

XPS investigations of surface segregation of doping elements in SnO2

D. Szczuko, J. Werner, Steffen Oswald et al. · Applied Surface Science · 2001 · 158 citations

Natural Sciences, Materials Engineering, Materials Science +14

Chemically-Selective and Spatially-Localized Redox Activity at Ta/Ta₂O₅Electrodes

Solomon B. Basame, Henry S. White · Langmuir · 1998 · 79 citations

Natural Sciences, Chemistry, Materials Science +17