Concepedia

Standard samples and calibration of PIXE analysis

Mikio Kasahara, Kenshi Takahashi, Masakatsu Sakisaka, Michio Tomita

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1993 · 19 citations · 4 references

DOI

Concepts

References

4

Analytical application of particle induced X-ray emission

Sven Johansson, Thomas B. Johansson · Nuclear Instruments and Methods · 1976 · 642 citations

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Experimental and theoretical calibration of a PIXE setup for K and L X-rays

I. Borbély‐Kiss, E. Koltay, S. László et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 60 citations

, , +16

On the status of preparing an aerosol filter reference material for elemental analysis

U. Wätjen, W. Dannecker, Michael Kriews · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1990 · 12 citations

, , +13

Thin reference layers available for calibration purposes in ion beam analysis

U. Wätjen, D. Schroyen, E. Bombelka et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1990 · 10 citations

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