Thin reference layers available for calibration purposes in ion beam analysis

How accurate are absolute rutherford backscattering yields

J. L’Ecuyer, John Davies, N. Matsunami · Nuclear Instruments and Methods · 1979 · 261 citations

Natural Sciences, Physics, Radiation Measurement +4

An intercomparison of spectral data processing techniques in PIXE

Willy Maenhaut, E. Bombelka, E. Clayton et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1986 · 68 citations

Pharmacy, Computer Science, Spectroscopic Analysis +10

Vacuum microbalance techniques

Vacuum · 1965 · 14 citations

Si(Li) detector lineshapes for PIXE analysis and improvement of the PIXE database

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1987 · 11 citations

Natural Sciences, Astronomy, Analytical Chemistry +13