Review of Scientific Instruments · 1995 · 66 citations · 8 references
EngineeringElectrical EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsThin FilmsDevice ModelingP-n JunctionsPhotodetectorsSemiconductor DetectorsSemiconductor Device MaterialsSemiconductor PhysicsCurrent DensityCurrent Density DistributionP-i-n PhotodetectorsP-n Junction CharacteristicsPhotodetectionPosition-sensitive DetectorsSpatial DetectionThin-film Detectors
The aim of this work is to provide the basis for the interpretation, under steady state conditions, of the lateral photoeffect in p-i-n a-Si:H one-dimensional thin-film position-sensitive detectors (1D TFPSD) and the determination of its linear spatial detection limits, function of the device, and light spot source characteristics. This leads to the development of a model, based on the application of the Poisson, continuity, and current density equations in the p-i-n junction, where two thin resistive layers, as equipotentials, are considered on both sides of the doped layers. The experimental data recorded in 1D TFPSD devices with different performances are compared with the predicted curves and the obtained correlations discussed.
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Electronic Processes in Noncrystalline Materials
R. A. Street · Physics Bulletin · 1973 · 1.6K citations
David Carlson · IEEE Transactions on Electron Devices · 1977 · 266 citations