Development of a new traceable areal surface texture measuring instrument

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	Year	Citations
Verification of the sub-nanometric capability of an NPL differential plane mirror interferometer with a capacitance probe M J Downs, John Nunn Measurement Science and Technology EngineeringMeasurementOptical TestingInterferometryEducation	1998	35
Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV Richard Leach Measurement Science and Technology EngineeringMicroscopyNanostructured SurfaceInterferometryOptical Metrology	2000	33
Some issues of traceability in the field of surface topography measurement Richard Leach Wear Geometric ModelingEngineeringSurveyingGeomorphologyCalibration	2004	16

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