Publication | Closed Access
Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV
33
Citations
16
References
2000
Year
EngineeringMicroscopyNanostructured SurfaceInterferometryOptical MetrologySurface TextureLaser FabricationCalibrationLaser-based SensorInstrumentationMaterials ScienceNew Surface TextureLength MetrologySurface FinishingTime MetrologySurface FinishSurface MetrologyOptical ComponentsNanosurf IvOptical SensorsSurface CharacterizationSurface AnalysisMaterials CharacterizationSurface ScienceApplied PhysicsLaser-surface InteractionsTraceable MeasurementMetrology
A new surface texture measuring instrument, known as NanoSurf IV, has been developed at the National Physical Laboratory. Laser interferometers provide traceable displacement measurements in both the vertical and scanning axes enabling surface texture to be measured with nanometre uncertainty. NanoSurf IV has a vertical range of 10 µm and horizontal range of 100 mm. The instrument is designed to calibrate surface texture standard specimens that can, in turn, be used to calibrate other instruments. The design of the instrument, its calibration and results obtained from surface texture calibration artefacts are presented.
| Year | Citations | |
|---|---|---|
Page 1
Page 1