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The maximum-entropy method in charge-density studies: aspects of reliability
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1993
Year
EngineeringNuclear PhysicsElectron DiffractionCharge TransportReliability EngineeringMem MapsThermodynamicsγ-Ray Diffraction DataMaterials SciencePhysicsMaximum-entropy MethodDevice ReliabilityCrystallographyPhysic Of FailureEntropyNatural SciencesX-ray DiffractionCondensed Matter PhysicsApplied PhysicsElectrical Insulation
The maximum-entropy method (MEM) was applied to accurate γ-ray diffraction data from MnF2 and NiF2 to explore details of the charge-density distribution. For a fair judgement of the results, Si Pendellōsung data [Saka & Kato (1986). Acta Cryst. A42, 469–478] were also treated. It is shown that conclusions drawn from MEM maps must be accepted with some reserve, particularly in the regions of interest in charge-density studies.