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AlGaN ultraviolet photoconductors grown on sapphire
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1996
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Wide-bandgap SemiconductorElectrical EngineeringOptical MaterialsEngineeringPhotochemistryApplied PhysicsMinimum Cutoff WavelengthAluminum Gallium NitrideGan Power DeviceAlgan Ultraviolet PhotoconductorsCarrier LifetimeGan DetectorOptoelectronics
AlxGa1−xN (0≤x≤0.50) ultraviolet photoconductors with a minimum cutoff wavelength shorter than 260 nm have been fabricated and characterized. The AlGaN active layers were grown on (00⋅1) sapphire substrates by metalorganic chemical vapor deposition (MOCVD). The spectral responsivity of the GaN detector at 360 nm is about 1 A/W biased at 8 V at room temperature. The carrier lifetime derived from the voltage-dependent responsivity is 0.13–0.36 ms.